Teradyne IP750 图像传感器测试仪
IP750 Test System
Test System for High-Speed, High-Quality Image Sensor Test
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
Applications
Still and Movie Cameras
Smartphones and Media Tablets
DSC cameras
Security cameras
Scanning imagery
Space satellite cameras
Image Detecting Devices
Automotive safety
Sensors for body scanners
X-rays
Infrared thermograph
Scanning imagery
Advantages
High Throughput
Powerful CPU for image data processing for high pixel resolution device
High speed data transfer at 40Gbps per instrument parallel
Up to 96 sites in parallel test with 16 slot test head
The highest parallelism with high parallel test efficiency available today ensures the lowest COT
Broad Device Coverage - up to 128M Pixels
High versatility for testing a broad range of devices – VGA to 32M pixels with ICUA analog capture and MIPI LVDS capture capability using ICMD
Only instrument solution in the market with custom LVDS protocol coverage
Strong SoC test capability with digital instrument for SoC type image sensor
Single Platform
Built on Teradyne’s J750 test platform
IP750 series can be upgraded on-site to IP750Ex-HD or J750Ex-HD to better utilize valuable assets in a rapidly changing market environment
Test Program Compatibility
IP750EP/EMP test programs can run on IP750Ex/Ex-HD with minor conversion
IG-XL Software
Built using Microsoft Excel which provides a user-friendly interface for fast program development
Enables easy upgrade of test programs from single to multisite, dramatically reducing the workload of test engineers on mass production launches
Common software environment for the IP750, J750, and FLEX family, eliminating the need to train test engineers for software programming on separate testers
Configurations
IP750Ex
32 site system capable for wafer test
ICMD 1.5Gbps MIPI D-Phy image capture instrument
Custom LVDS capture capability with ICMD
ICUA2 up to 100MHz analog image capture instrument
ICUD200 200MHz 32M pixel / Channel 24 bit depth/pixel
HSD200 200MHz Digital instrument
HDDPS 24/48Ch DC source
20Gbps image data transfer
110mm diameter illuminator support
IP750Ex-HD
96 site system capable for wafer test
ICMD 1.5Gbps MIPI D-Phy image capture instrument
Custom LVDS capture capability with ICMD
HSD800 400MHz Digital instrument
HDDPS 24/48Ch DC source
40Gbps image data transfer
150mm x 160mm illuminator support
Compatible with J750Ex-HD instruments
System Options
VI Resource
APMU
HDAPMU
HDVIS
Converter Test
CTO
HDCTO
Software
IG-XL-245x100-TeradyneTeradyne’s award-winning IG-XL Software transforms test program development. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
Learn more about IG-XL Software
