Epson NS-7000 集成电路测试机

NS7000 Series

NS7160W

• Best handler for multi-site testing of integrated logic/memory devices
• Capable of 16-site simultaneous testing

NS7080W

• Expanded socket area enables docking to a wide variety of socket layouts

Feature

1. Fllexible socket layout
   • Wide range of available socket layouts including "square 4-site"
2. Outstanding basic functions
   • High throughput of 7300 UPH (units per hour) and index times from 0.36 sec.
   • Steady temperature due to use of a chamber in the test site
3. Compatible with a wide range of device types (small, thin, etc.)
   • Damage-free testing of ultra thin devices in soft contact mode
   • Capable of testing small devices such as MLPTM and MLFTM
   • Capable of testing CMOS image sensors and RF devices
4. Contact force controlled by electro-pneumatic regulator
5. Auto teaching
   • Capable of auto teaching using auto-teaching jigs
6. ESD (electrostatic discharge) reduction
   • Can provide required level of ESD protection
7. Multi-lingual operation screen
   • Multi-language support available for operation screens
8. Side-docking test head
9. CE marking
10. Options
    • One-touch Lock socket Plate
    • High Contact Pressure
    • Motor Rotator Hand
    • Wide Hot Plate
    • Cross Sensors
    • Different Tray Handling for Loading/Unloading

Main specifications